| Course title |
Scanning Probe Microscopy in Nanoscience and Nanotechnology |
| Acronym |
19D061SMNN |
| Study programme |
Electrical Engineering and Computing |
| Module |
Nanoelectronics and Photonics |
| Type of study |
doctoral studies |
| Lecturer (for classes) |
|
| Lecturer/Associate (for practice) |
|
| Lecturer/Associate (for OTC) |
|
| ESPB |
9.0 |
Status |
elective |
| Condition |
- |
| The goal |
Introducing students to the techniques of atomic force microscopy (AFM), scanning tunneling microscopy (STM) and scanning electron microscopy (SEM). Introducing to the methods for topographic imaging of surfaces and characterization of their physical properties (mechanical, electrical, opto-electric, ferroelectric, magnetic) on the nanoscale. |
| The outcome |
Developing the ability of students to use scanning microscopy techniques in scientific work in order to investigate various nanostructures and materials such as two-dimensional materials, thin films, heterostructures, nanocrystals, quantum dots, nanoparticles, etc. |