DS2OMM - Optoelectronic Measuring Methods
|Optoelectronic Measuring Methods
|Electrical Engineering and Computing
|Nanoelectronics and Photonics
|Type of study
|Lecturer (for classes)
|Lecturer/Associate (for practice)
|Lecturer/Associate (for OTC)
|Introduction to the scientific research in the field of optoelectronic measuring methods. Mastering the methods for environment properties measurements, using the environment influence on the wave nature of light. There is an opportunity for further research in the application of new optoelectronic methods, designed for modern industrial measurement and quality control.
|A student should be able to propose and design industrial measuring system or quality control system based on the modulation of light.
|Contents of lectures
|The optical properties of materials. The optical properties of the atmosphere. Guided optical waves. Induced optical effects. Nonlinear effects. Noise, interference and environmental influence on the measurement. Optical methods for measuring fast physical properties. Optical methods for high-voltage environments. Characterization of surfaces by image processing algorithms.
|Contents of exercises
|Number of hours per week during the semester/trimester/year
|Study and Research
|Methods of teaching
|lectures and auditory exercises
|Knowledge score (maximum points 100)
|Activites during lectures